Innovative Research and Development
 

International Test Solutions works closely with customers to fully understand their cleaning requirements and then provide a complete cleaning solution.

  ITS Product Line Technical Briefs
   Probe Clean™ - Increased Wafer Yield
   Probe Polish™ - Non-destructive On-line Probe Card Cleaning
   Probe Scrub™ - Restore Probe Performance
   Probe Lap™ - Reduced Debris Generation during Abrasive Cleaning
   Probe Form™ - Improve Contact Resistance Stability

ITS Cleaning Workshop - "Probe Card Cleaning Economics and Methodologies for High Volume Wafer Sort"
   Please contact International Test Solutions directly for additional details

  IEEE SouthWest Test Workshop (SWTW)
   2000 - Probe Card On-line Cleaning
   2002 - Extending Probe Card Life for Fine Pitch Probe Cards
   2003 - Controlling Contact Resistance with Probe Tip Shape and Optimized Cleaning
   2004 - Extending Probe Card Lifetime: An "Abrasive" Approach
   2005 - Approach to Control CRES Instability and Improve First Pass Yield of Bumped Devices
                Awarded "Best Overall Presentation at SWTW-2005"
   2006 - Novel Methodologies for Assessing On-line Probe Process Parameters
                Download the "Probe Performance Visualization Videos" (~30MB)
                Awarded "Most Inspirational Presentation at SWTW-2006"
    2007 - Probe Card Cleaning “A Short Tutorial”
    2007 - Control of Pad Damage Using Prober Operational Parameters
               
ITS Collaborative Efforts and References (downloads are made available with author permission)
   Presented at SWTW-2006 by Jan Martens, Philips Semiconductors Hamburg
      Fritting: Experiences with Non-Ohmic Contact Resistance while Wafer Test Probing
                Awarded "Best Overall Presentation at SWTW-2006"

   Presented at SWTW-2006 by Frederick Taber, Consultant
      Maximizing the Performance of an Atypical Cantilever Probe Wire Material

  European Manufacturing Test Conference (EMTC)
   2006 - Extending Probe Card Life with Tip "Refreshing" Methodologies
                Download the "Flat-Tip Shaping Video" (5MB)
   2007 - Off-line Methodologies to Assess On-line CRES Performance for Cleaning Optimization


  IEEE International Test Conference (ITC)
   2004 - The Leading Edge of Production Wafer Probe Test Technology
   2007 - Wafer Probe Test Technology Tutorial
 
  Burn-In Test Socket (BiTS) Workshop
   2004 - Controlling Test Cell Contact Resistance with Non-destructive Conditioning Practices

  European IS-Test Workshop
   2007 - Variations of Chuck and Cleaning Unit Surfaces when probing at temperature

  EE - Evaluation Engineering
   2004 - Controlling Contact Resistance with Probe Tip Shape and Optimized Cleaning Recipes