Product Announcement: New 0.5μm Probe Lap® Lapping Film
Since 1999, International Test Solutions has been designing and manufacturing
cleaning materials for advanced probe cards, test sockets, and equipment chucks
for wafer sort/probe, final test/burn in, and semiconductor fabrication operations.
These cleaning materials enable device manufacturers and foundries to maximize
uptime and throughput for substantial test cost savings.
As a part of ITS’s commitment to improve quality and develop materials with superior
performance across an extended temperature range, ITS is releasing a high
performance 0.5μm lapping film which will replace our current 0.5 micron Probe
Lap. This new 0.5μm Probe Lap material has more uniform performance across an
extended temperature range while maintaining low wear characteristics.
Some of the advantages of the new 0.5μm Probe Lap lapping film are as follows:
• Improved thermal stability from -50C to 200C
• Low wear rates as compared to traditional 0.5μm lapping films
• Improved surface uniformity for improved surface texturing
• Improved durability for substantially longer life time
• Lower overall cost
The new 0.5μm Probe Lap will replace the current 0.5μm Probe Lap and is available
If you have any questions please contact your regional sales office or ITS directly at
1595 Meadow Wood Lane, Reno, NV 89502 or by telephone at +1 775-284-9220.